Atomic sputtering in the Analytical Electron Microscope

Prospects for Trace Analysis in the Analytical Electron-Microscope

The analytical electron microscope (AEM) uses a high energy (>100 kV) beam of electrons to generate a range of signals from a thin foil sample as shown in figure la [1,2]. Various detectors are configured in the AEM to pick up most of the generated signals (fig. lb). Microanalysis is usually performed using the characteristic x-ray signal, detected by an energy dispersive spectrometer (EDS) alt...

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

Development of Holography Electron Microscope with Atomic Resolution

THE transmission electron microscope was invented in Germany in 1932. It works by directing a beam of electrons through a specimen and then using a lens to enlarge the image formed by their passage. In Japan, development and research into its applications began in 1939, and numerous companies around the world have competed to develop the instruments since Hitachi developed its own fi rst transm...

Characterization of Metallic Nanowires by Combining Atomic Force Microscope (AFM) and Scanning Electron Microscope (SEM)

A new experimental method is introduced in order to characterize the mechanical properties of metallic nanowires. An accurate mechanical characterization of nanowires requires simultaneous imaging using scanning electron microscope (SEM) and mechanical testing with an atomic force microscope (AFM). In this study, an AFM is located inside an SEM chamber in order to establish the visibility of th...

Surface Analysis Studies on Polymer Electrolyte Membranes Using Scanning Electron Microscope and Atomic Force Microscope